Reduced Graphene Oxide Via Green Route Exposure of Gamma (℘) Ray for Surface Morphological Investigation

Volume 1 - Issue 2

Force Tefo Thema*

Received: May 04, 2018;   Published: May 22, 2018

DOI: 10.32474/ANOAJ.2018.01.000106

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Abstract

γ-ray radiation was used to reduce graphene oxide thin films to partially reduced graphene oxide films at ambient conditions. Micro-Raman spectroscopy showed that irradiation of GO with γ-rays did not change the structure of graphene. The γ-rays are only active on the oxygen functional groups bonds because they are short and highly energized wavelengths. γ-rays penetrate the C-C lattice isotropically hence sustaining the graphene layer structure. This results in transparent and intact r-GO thin films with no structural defects. The defects on the structure would result to the opaqueness of the C-C lattice hence compromising the transparency of the material. The Scanning electron microscopy, Transmission Scanning electron, Fourier transform infrared and Raman spectrometry are presented.

Abbrevations:ITO: Indium Tin oxide; TCOs: Transparent Conducting Oxide; GFs: Graphene flakes; FE-SEM: Field Emission Scanning Electron Microscope; TEM: Transmission Electron Microscope; GO: Graphene oxide; FTIR: Fourier Transform Infrared

Abstract| Introduction| Characterization| Experimental Methods & Results| Results and Discussion| Conclusion| References|