Wheat Leaf Rust Detection at an Early Stage with Atomic Force Microscopy (AFM)

Volume 2 - Issue 3

Zeeshan Haider¹, Nouman Hassan², Arshad Maryam², Shamaraz Firdous³*, Uzma Aziz³ and Arshad Mehmood³

Received: March 08, 2019;   Published: March 19, 2019

DOI: 10.32474/OAJESS.2019.02.000138

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Abstract

In this study, we demonstrated the early stage wheat rust diagnosis using Atomic Force Microscopy (AFM). Wheat rust is a common disease, caused by parasitic fungus and reduces crop yield up to 30 to 40 percent by effecting leaf and stem of plant. The wheat seed having fungus are the carrier of rust infection for the plant. The infected seed and rust fungus not only reduce food quantity but effect its quality. In our experimental research, the wheat leaf sample of day 10, 27, 35 and 45 were analyzed. The rust appears after day 24 on leaf, and rusted leaf has higher surface roughness than the normal one. We analyzed shape, surface structure of normal and rusted wheat leaf surface with AFM. The leaf protein and structure with high-resolution AFM imaging under controlled environmental conditions. The results revealed the morphological details of normal and viral infected proteins of wheat leaf with high-resolution in vivo study. The findings provide the basis for AFM as a useful tool for investigating microbial-surface structures and properties at an early stage of rust. We can visualize the starch granule surface at different stages of maturity reveals information regarding the development of granule architecture. The changes in infected leaf compared to normal can be seen at starch granule interior throughout the growth. Leaf surface shows depressions on the granule surface and changes in protein for the infected, and we can manage the disease at an early stage of rust development. These results will be used for an early stage detection of wheat rust and can be extended to other crops diseases detection using AFM and laser-scanning microscopy.

Keywords:Atomic Force Microscopy (AFM); Wheat Rust; Fungal Infection; viral detection

Abstract| Introduction| Materials and Methods| Results and Discussion| Conclusion| References|