Trace Element Analysis of Dental Powders by X-ray
Fluorescence Technique
Volume 2 - Issue 1
Daisy Joseph*
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- Nuclear Physics Division, BARC, India
*Corresponding author:
Daisy Joseph, Nuclear Physics Division, BARC, Trombay, Mumbai, India
Received:August 20, 2019; Published:September 17, 2019
DOI: 10.32474/ANOAJ.2018.01.000131
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Abstract
Dental powder has been analyzed using conventional XRF and handheld XRF (HHXRF). The spectrum shows a large amount
of Si, K, Ca and Zr in XRF and Al in HHXRF. The HHXRF has an advantage of showing Al which is a prominent element in dental
powders. To obtain Al which is present in dental powders HHXRF is the preferred technique to conventional XRF. The present work
will highlight the experimental technique, elements expected in dental powder and conclusions therein
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